Electronics Science Technology and Application

2018

Volume 5 , No 2

DOI: http://dx.doi.org/10.18686/esta.v5i2

Table of Contents

Original Article

Weijuan Dun, Guangwei Jia, Wei Yan, Wei Li, Xun Yang
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Ze Li, Li Wang, Subin Li, Xinjing Zhang, Guosen Zhou
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